CHARACTERIZATION OF SURFACE OF THE (010) FACE OF BORAX CRYSTALS USING EX SITU ATOMIC FORCE MICROSCOPY (AFM): CLEAVAGE AND CLEAVAGE STEPS
ABSTRACT: The surface topology
of borax crystals grown at a relative supersaturation of 0.21 has been investigated
using ex situ atomic force microscopy (AFM). It was found that the cleavage of
borax crystals along the (010) face planes has features of the cleavage of
layered compounds, exhibiting cleavage steps of low heights. The step heights
of the cleavage of the (010) face of borax crystal are from one unit cell to three
unit cells of this face.
Author: Suharso
Journal Code: jpkimiagg050020
